Xenon Pulse Light Source |
with Beam ConditionerAM1.5G Filter |
脈沖氙燈光源, 包括AM1.5G濾鏡 |
Digital Pulse Sequencer Power Supply |
數(shù)據(jù)脈沖程序裝置電源 |
PC Control Computer with Custom Control |
Software |
PC計(jì)算機(jī)控制, 含用戶操作軟件 |
6”×6” High Quality Special UV Filter |
6”×6”高品質(zhì)特制紫外濾鏡 |
Current-Voltage Measurement System for |
Pulse Solar Simulators |
I-V曲線測試系統(tǒng), 用于脈沖太陽模擬器 |
Solar Cell Testing Workstation |
太陽模擬器工作站試驗(yàn)室 |
Air Mass Filters, 3 pieces. 2”×2”. |
Index: AM0, AM1.0AM2.0 |
AM空氣質(zhì)量比系列濾鏡, 含AM0,AM1.0和AM2.0三種 |
applicationsthe primary use of this pulse generator is to simulate actual operating conditions without requiring a live source and detector combination. such parameters as frequency response, linearity, and discrimination levels may easily be measured without the inconvenience of dim oscilloscope display or long accumulation times. proper operation of baseline restorer circuits may be quickly verified. scalers and ratemeters may be checked for satisfactory pulse recognition under random pulse conditions.
the negligible amplitude shift with frequency of the pulser makes the standard frequency test using a live source and a low rate precision pulse generator unnecessary.
although most test applications will find the pulser connected to the test input of a charge sensitive preamplifier, it is possible to simulate the preamp itself with the pulse generator. the pulser is connected directly to the main amplifier and the preamp decay time constant is matched by proper se-lection of the pulser fall time. set up of a system containing an inaccessible preamp can then be accomplished with ease.
for accurate simulation of detector pulse shapes, the rise time control should be adjusted to match 2.2 times the detector decay time constant. for example, if a pulse shape analyzer working with csi-nai phoswich is to be tested, the pulse generator rise time should be set to 0.5 μsec rise time for the nai signal, and 2 μsec for the csi signal. intermediate signals are best obtained by mixing the outputs from two synchronized generators, 2 μsec rise time. by varying the amplitude ratio of the two generators, intermediate values of rise time are generated.
solid state and plastic detectors have decay constants far shorter than the adjustment range of this generator. however, the shaping time constants used in virtually all systems are greater than the 100 nsec minimum rise time. the ballistic deficit formula predicts the reduction in amplitude, b. d., for a shaping system containing identical time constants for all shaping.
b.d. = (4)
where n = the number of integrations with time, constant =rc, and tr is the rise time of the preamp output. the preamp output rise time may be calculated from:
(5)
where tp is the pulser rise time and ti is the rise time of the preamp in response to a unit step of zero rise time. the ballistic deficit for a preamplifier with a ti of 10 nsec used with a shaping amplifier6 with 1 μsec time constants would be only 0.02% when used with this pulse generator. therefore, the ballistic deficit caused by this pulser may be ignored for most applications.
the external reference allows remote programming of the amplitude of the pulser, and the external trigger permits control of the output pulse rate. the latter provision is especially convenient if the average random rate needs to be controlled and an external random clock is unavailable. by placing the pulser in the random mode, a periodic waveform at the external trigger input will control the average random rate.
D-4檢測器利用穩(wěn)定低壓直流電流在氦氣中脈沖放電作為電離源,尾吹放電氦氣在流經(jīng)放電區(qū)域時(shí)被激發(fā)為亞穩(wěn)態(tài)氦。目標(biāo)樣品從色譜柱洗脫后被載氣帶入檢測器,樣品分子或原子被亞穩(wěn)態(tài)氦分子碰撞電離產(chǎn)生電子。放射的電子在偏壓極電場的作用下被收集極捕獲形成電壓信號(hào),這個(gè)信號(hào)經(jīng)過放大處理后即為該樣品的色譜峰。
在電子捕獲模式,PDD為選擇檢測器來監(jiān)控高電子親和力的化合物如氟里昂、含氯殺蟲劑和其他鹵素化合物。對(duì)于此類化合物,檢測限(MDQ)為“femtogram”(10-5)或皮克(10-12)級(jí)。PDD與常規(guī)放射ECD的靈敏度和響應(yīng)特征相類似,且可在高達(dá)400℃的溫度下操作。在此模式下工作,He和CH4從柱出口剛好逆流引入。
在氦氣光化電離模式,PDD為通用的、非破壞性的、高靈敏度檢測器。對(duì)無機(jī)和有機(jī)化合物均在很寬的范圍內(nèi)呈線性,對(duì)fixed氣體的反應(yīng)為正電(穩(wěn)定電流增加),檢測限MDQ低至ppb級(jí)。
在氦氣光化電離模式下的PDD為石油化學(xué)或煉油廠環(huán)境的火焰離子檢測器一個(gè)極好的替代產(chǎn)品,而它火焰和氫氣的使用存在問題。另外,當(dāng)氦氣放電氣體與適當(dāng)?shù)亩栊詺怏w如氬、氪或氙(決定于期望的截止點(diǎn))混合時(shí),PDD可作為特殊光化電離檢測器用于脂肪族化合物、芳香族、胺以及其他物質(zhì)選擇檢測。
D4檢測器本質(zhì)上是高靈敏度的非破壞性檢測器(0.01-0.1%電離)。檢測器對(duì)有機(jī)物的響應(yīng)線性范圍高達(dá)105,最小檢測限低至10-12g。對(duì)特定氣體的響應(yīng)高(駐流增加),最小檢測濃度達(dá)ppbv。
D4檢測器是通用型檢測器,除氖氣(電離能21.6eV)外所有物質(zhì)均有響應(yīng)。由于氖氣的電離能接近亞穩(wěn)態(tài)He*原子的電離能(19.8eV)而遠(yuǎn)大于雙原子氦He2光譜中的光子能,氖的電離效率比較低,因此檢測器響應(yīng)十分有限。
在氦氣中摻雜一些其他氣體,比如檢測有機(jī)物質(zhì)時(shí)加氬、檢測不飽和成分時(shí)加氪、檢測多環(huán)芳香烴時(shí)加入氙等,D4檢測器就可以選擇性光電離檢測器的模式工作。
PDD D-4型—氦氣光化電離
描述
在氫氣光化電離模式下痕量分析檢測器
檢測器專門用于 110VAC貨號(hào) 230VAC貨號(hào)
HP 5890 | | |
Shimadzu GC 14* | | |
Shimadzu GC 14* | | |
Thermo Trace GC* | | |
Varian 3800* | | |
*使用已有的GC FID靜電計(jì) | | |
用于所有其他GC | | |
主要參數(shù)
1.試樣大。骸30mm
2.試樣厚度:0.02-10mm
3.導(dǎo)熱系數(shù)范圍:
0.001-500W/MK,
4.式樣形狀可以是顆粒,片狀等。
5.可同時(shí)測1-5個(gè)樣品。
6.加熱方式:激光或脈沖電流。
7.精度:±2%
8.測試環(huán)境工況:
常溫-1600℃,-100℃---600℃(可選)DMF-Z型電磁脈沖閥的詳細(xì)資料: |
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SLPM型磁保持脈沖電磁閥
規(guī)格型號(hào) | SLPM-10 | SLPM-15 | SLPM-20 | SLPM-25 | SLPM-35 | SLPM-40 | SLPM-50 |
長(A) | 66.5 | 66.5 | 75 | 96 | 131 | 131 | 165 |
寬(B) | 48 | 48 | 58 | 70 | 96 | 96 | 120 |
高(C) | 82.5 | 82.5 | 88 | 101 | 116 | 116 | 142 |
接管螺紋(D) | 3/8" | 1/2" | 3/4" | 1" | 11/4" | 11/2" | 2" |
注: 具體技術(shù)參數(shù)請電函聯(lián)系
SLPM型磁保持脈沖電磁閥結(jié)構(gòu)規(guī)格參數(shù)
規(guī)格型號(hào) | SLPM-10 | SLPM-15 | SLPM-20 | SLPM-25 | SLPM-35 | SLPM-40 | SLPM-50 |
接管口徑 | 3/8" | 1/2" | 3/4" | 1" | 11/4" | 11/2" | 2" |
使用流體 | 水、過濾空氣(給油或不給油)、液體、輕油 | ||||||
動(dòng)作方式 | 先導(dǎo)式 | ||||||
型式 | 常閉式 | ||||||
流量孔徑 | 13mm | 13mm | 20mm | 25mm | 35mm | 40mm | 50mm |
CV值 | 4.5 | 4.5 | 7.6 | 12 | 22 | 30 | 48 |
使用壓力 | 0.5~10kgf/cm2 | ||||||
最大壓力 | 15kgf/cm2 | ||||||
膜片形式 | 標(biāo)準(zhǔn):NBR 選購:VITON,EPDM | ||||||
溫度范圍 | 0℃~60℃ | ||||||
使用電壓范圍 | 脈沖6~24V DC 其它電壓可定制 | ||||||
脈寬 | 60~80ms | ||||||
本體本質(zhì) | 鍛鋼 |